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Staff and postgraduate students:
Ziganshina S.A.(Ph.D.), Biziaev D.A., Borodin P.A., Nurgazizov N.I.(Ph.D.), Chuklanov A.P.(Ph.D.), Gatiatov R.G., Lebedev D.V.
Main fields of research:
The investigation of physicochemical properties of nanostructures and mechanisms of their formation at the solid surfaces with scanning probe microscopy techniques.
Directions and results of research
The study of physicochemical properties of nanoscale materials and the investigation of micro- and nanostructure formation on the solid surfaces. Submicron periodical structures formed on the surface of implanted SiO2 under the influence of a nanosecond laser have been investigated with the atomic force microscope (AFM). It has been shown that this material might be used as a medium for optical recording of information at the density of no less than 107 bit/cm2.
It has been originally established that the laser annealing of a-Fe ferromagnetic particles dispersed in silicon dioxide causes an ordering of their crystalline structure and an increase of the coercivity, while the millisecond light annealing or the ordinary thermal annealing converts a-Fe particles into a-Fe2O3 ones.
Liquid etching of SiO2 modified through the ion bombardment has been examined in situ and ex situ with the aid of AFM as well as wiht other techniques. A model accounting for the surface transformation in these media during the etching, specifically, for the change in optical and magnetic properties of SiO2 two-phase nanostructures with a-Fe nanoparticles has been suggested. In cooperation with our German counterparts, applying AFM and magnetic force microscopy we investigated isolated Ni nanoparticles on SiO2 obtained with the autocoalescence method. It has been shown that Ni nanoparticles less than 100 nm in size represent single-domain particles that are readily remagnitized in the sense of the external field with their homogeneous magnetization persisting. Remagnetization of larger Ni axial particles is determined by their configuration anisotropy.
Engineering of apparatus and development of new techniques for scanning probe microscopy. Several modified types of scanning tunneling microscopes designed to work either in ambient air or in the controlled atmosphere have been created. Specifically, they were used to visualize periodical changes of the conductivity in the near-surface layer of implanted Si, induced by a local phase transition of the amorphous silicon into the crystalline state in the pulsed interference laser annealing experiment.
The new in situ methods to study kinetics of liquid chemical and photochemical etching of solids with AFM are engineered. А new method for numerical reconstruction of surface images that ensures a considerably higher accuracy of the AFM imaging of nano-sized particles is devised, patented and brought into common use.
Currently, work on improving magnetic force microscopy techniques to study processes of remagnetization of micro- and nanoparticles is underway; efforts are being made to apply a computer simulation procedure for the analysis of images obtained with the probe microscope as well as for the study of dissolution processes in multiphase media.
Contacts with the other institutions, international co-operation
- Kazan State University, Kazan
- Kazan State Technological University, Kazan
- Institute of Crystallography of RAS, Moscow
- Institute of Solid State Chemistry of the Siberian Branch of RAS, Novosibirsk
- Weizmann Institute of Science, Rehovot, Israel
- Hamburg University, Hamburg, Germany
Basic publications
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Bukharaev A.A.: Tunneling and Atomic Force Microscopy Investigation of Surfaces Modified by Ionic and Laser Beams. Usp.Fiz.Nauk 166, № 2, 210–213 (1996)
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Bukharaev A.A., Janduganov V.M., Samarsky E.A., Berdunov N.V.: Atomic Force Microscopy of Laser Induced Sub-Micrometer Periodic Structures on Implanted Fused Silica and Silicon. Appl. Surf. Sci. 103, 49–54 (1996)
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Bukharaev A.A., Janduganov V.M., Samarsky E.A., Berdunov N.V., Antonov P.G.: Effects of Stimulated Adsorption in Scanning Tunneling Microscopy Investigation of Si Surface in Ambient Air. J. Vac. Sci. Technol. B 13, 1274–1279 (1995)
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Bukharaev A.A., Kukovitskij E.F, Ovchinnikov D.V., Sainov N.A., Nurgazizov N.I.: Scanning Force Microscopy of Catalytic Nickel Particles, Obtained from Carbon Nanotubes. Fiz.Tverd.Tela 39, 2065–2072 (1997)
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Bukharaev A.A., Berdunov N.V., Ovchinnikov D.V., Salikhov K.M.: SFM-Metrology of Micro- and Nanostructures. Mikroelektronika 26, 163–175 (1997)
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Bukharaev A.A., Ovchinnikov D.V., Nurgazizov N.I., Kukovitskij E.F., Klaiber М., Wiesendanger R.: The Investigation of Micromagnetism and Remagnetization of Nickel Micro- and Nanoparticles by Means of Atomic Force Microscope. Fiz.Tverd.Tela. 40, 1277–1283 (1998)
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Bukharaev A.A., Nurgazizov N.I., Mozhanova A.A., Ovchinnikov D.V.: In Situ Atomic Force Microscopy Investigation of Kinetics of Liquid Chemical Etching of Silicon Dioxide Submicrone Films. Mikroelektronika 28, 385–394 (1999)
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Markiewicz P., Cohen S.R., Efimov A., Ovichinnikov D.V., Bukharaev A.A.: SPM Tip Visualization through Deconvolution Using Various Characterizers: Optimization of the Protocol for Obtaining True Surface Topography from Experimentally Acquired Images. Probe Microscopy 1, 355–364 (1999)
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Gubaidullin F.F., Bukharaev A.A., Nazarov A.V.: Surface Investigation Technique by Means of Tunneling Microscope. Patent of Russian Federation for the invention № 1778820 (1995)
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Head of the laboratory:
